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[Long lifespan, high durability type] Diamond probe for AFM/SPM

AFM/SPM probes boasting long lifespan and high durability with diamond coatings and single crystal diamonds.

This is a probe for atomic force microscopy and scanning probe microscopy. It features a diamond coating on the tip, or the tip itself is made of single crystal diamond, providing high stability, wear resistance, and durability for a long-lasting probe. ● Diamond Coated Probes - DCP Series: Probes with conductivity due to nitrogen-doped diamond coating. - HA_DCP Series: Probes with cantilevers at both ends of the chip and two different diamond-coated tips. ● Single Crystal Diamond Probes - DEP Series: Probes with conductivity, treated with boron-doped diamond coating on single crystal diamond. - DRP Series, DPRS Series: Probes designed for applications involving high mechanical loads and scratch tests. - FD Series: Probes that are insensitive to static electricity on the sample surface, making them easy to approach and suitable for topography imaging.

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  • Analytical Equipment and Devices
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